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Product Overview |
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The MEM-DR416L-HL03-ER26 Supermicro memory module provides 16GB of DDR4 memory with ECC support, running at 2666MHz. Its registered DIMM design is tailored for enterprise server environments where data integrity and system stability are required. |
General Information |
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| Brand | Supermicro |
Technical Information |
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| Memory Capacity | 16GB |
| Memory Technology | DDR4 |
| Module Type | RDIMM |
| RAM Standard | PC4-21300 |
| Pin Count | 288-Pin |
| Error Correction | ECC |
| Voltage | 1.2V |
Performance |
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| Bus Speed | 2666MHz |
| Bandwidth | 21300 MB/s |
| Native Speed | 2666 MT/s |
Physical Characteristics |
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| Weight | 3.00 |
| Condition | Refurbished |
Miscellaneous |
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| Assembly Required | No |
Product Description |
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The MEM-DR416L-HL03-ER26 is a 16GB DDR4 ECC RDIMM memory module from Supermicro designed for use in server and enterprise-class computing environments. It provides error-correcting capabilities that help detect and correct data corruption, enhancing system stability. This memory operates at a frequency of 2666MHz, making it suitable for workloads requiring consistent memory performance. IT professionals and system administrators typically deploy this module in servers and workstations that support DDR4 ECC RDIMM to maintain data integrity and optimize memory reliability. Key Features
This memory module plays a critical role in maintaining system uptime and preventing data errors in demanding server applications. By integrating ECC with a registered design, it supports stable operation under heavy workloads while ensuring compatibility with enterprise-grade hardware platforms. |
Use Cases |
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This 16GB DDR4 ECC RDIMM module is typically used in enterprise servers and workstations requiring error-correcting memory to reduce data corruption risks. It suits environments running data-intensive applications where system reliability is crucial. How It's Used:
In these contexts, the memory module supports stable system operation and helps maintain data integrity, contributing to overall system reliability in critical computing environments. |
FAQ's |
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